0315084 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Radlička, Tomáš - Lencová, BohumilaInfluence of tilt of sample on axial beam properties.
[Vliv náklonění vzorku na vlastnosti osového svazku.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 599-600. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : parasitic aberration * misalignment aberrations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004855