0109049 - UPT-D 20040050 RIV CZ eng C - Conference Paper (international conference)
Romanovský, V. - El Gomati, M. M. - Frank, Luděk - Müllerová, IlonaElectrostatic Low Energy Scanning Electron Microscope for Auger Analysis.
[Elektrostatický nízkoenergiový rastrovací elektronový mikroskop pro Augerovu analýzu.]
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 65-66. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : scanning low energy electron microscope * scanning Auger microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016161
