Basket

0104231 - FZU-D 20040573 RIV GB eng J - Journal Article
Zemek, Josef - Jiříček, Petr - Lesiak, B. - Jablonski, A.
Elastic electron backscattering from silicon surfaces: effect of charge-carrier concentration.
[Pružný odraz elektronů od povrchu křemíku: vliv koncentrace nosičů náboje.]
Surface and Interface Analysis. Roč. 36, - (2004), s. 809-811. ISSN 0142-2421. E-ISSN 1096-9918
R&D Projects: GA ČR GA202/02/0237
Institutional research plan: CEZ:AV0Z1010914
Keywords : elastic peak electron spectroscopy(EPES) * inelastic mean free path(IMFP) * elastic electron backscattering probability * charge-carrier concentrations * silicon
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.209, year: 2004
Permanent Link: http://hdl.handle.net/11104/0011506