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0050901 - ÚPT 2007 RIV JP eng C - Conference Paper (international conference)
Müllerová, Ilona
Scanning Low Energy Electron Microscopy.
[Rastrovací nízkoenergiová elektronová mikroskopie.]
Proceedings of the 16th International Microscopy Congress - IMC16 (Vol. 2). Sapporo: Japanese Society of Microscopy, 2006, s. 651.
[IMC16 - International Microscopy Congress /16./. Sapporo (JP), 03.09.2006-08.09.2006]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * cathode lens mode * very low energies
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0140934