0049009 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Frank, LuděkThe Dopant Contrast – A Challenge to Electron Microscopy.
[Kontrast dopantu – otázka pro elektronovou mikroskopii.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 19-22. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant contrast * SEM * PEEM * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139506
