0022520 - ÚPT 2006 RIV US eng C - Conference Paper (international conference)
Šiler, Martin - Šerý, Mojmír - Čižmár, Tomáš - Zemánek, PavelSubmicron particle localization using evanescent field.
[Lokalizace submikronové částice pomocí evanescentního pole.]
Optical Trapping and Optical Micromanipulation II. (Proceedings of SPIE Vol. 5930). Belingham: International Society for Optical Engineering, 2005, s. 182-190. ISBN 0-8194-5935-6. ISSN 0277-786X.
[Optical Trapping and Optical Micromanipulation II. San Diego (US), 31.07.2005-04.08.2005]
Grant - others:EC 6FP(XE) ATOM3D No. 508952
Institutional research plan: CEZ:AV0Z20650511
Keywords : total internal reflection * evanescent wave * optical force * colloidal particle * interference optical trap
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0111249
