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  1. 1.
    0022405 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
    Müllerová, Ilona
    What can we see at very low energies in the Scanning Electron Microscope?
    [Co můžeme vidět v rastrovacím elektronovém mikroskopu na velmi nízkých energiích?]
    Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 51. ISBN N. ISSN 1019-6447.
    [Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
    R&D Projects: GA ČR(CZ) GA102/05/2327
    Keywords : low energy electrons * detection system * scanning elektron microscope
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0111145
     
     

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