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1.

0134255 - FZU-D 20030151 RIV FR eng B - Monography
Lipavský, Pavel - Morawetz, K. - Špička, Václav - Suraud, E. (Editor)
Kinetic equation for strongly interacting dense Fermi systems.
Les Ulis Cedex A: EDP Sciences, 2001. 254 s. Les Annales de Physique., 26. ISBN 2-86883-541-4. ISSN 0003-4169
Institutional research plan: CEZ:AV0Z1010914
Keywords : kinetic equations * dense Fermi systems * non-instant and non-local picture of binary collisions
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0032169

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0452538 - ÚTIA 2016 RIV CH eng C - Conference Paper (international conference)
Grim, Jiří - Pudil, P.
Mixtures of Product Components versus Mixtures of Dependence Trees.
Computational Intelligence. Cham: Springer, 2016, s. 365-382. Studies in Computational Intelligence, 620. ISBN 978-3-319-26393-9.
[IJCCI 2014 - International Joint Conference on Computational Intelligence (Rome/Italy). Rome (IT), 22.10.2014-24.10.2014]
R&D Projects: GA ČR(CZ) GA14-02652S
Grant - others:GA ČR(CZ) GAP403/12/1557
Institutional support: RVO:67985556
Keywords : Product mixtures * Mixtures of Dependence Trees * EM algorithm
Subject RIV: BD - Theory of Information
Result website:
http://library.utia.cas.cz/separaty/2016/RO/grim-0452538.pdf

DOI: https://doi.org/10.1007/978-3-319-26393-9_22
Permanent Link: http://hdl.handle.net/11104/0257056

3.

0351882 - ÚJF 2011 CA eng A - Abstract
Macková, Anna - Malinský, Petr - Hnatowicz, Vladimír - Khaibullin, R. I. - Slepička, P. - Švorčík, V. - Šlouf, Miroslav - Peřina, Vratislav
Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties.
17th International conference on ion beam modification of materials, book of abstracts. Vol. P2-4-146. 2010. Roč. 2010 (2010), s. 127-127.
[17th international conference on ion beam modification of materials. 22.08.2010-27.08.2010, Montreal]
R&D Projects: GA AV ČR(CZ) KAN400480701; GA ČR GA106/09/0125
Institutional research plan: CEZ:AV0Z10480505; CEZ:AV0Z40500505
Keywords : Ni ion implantation * polymers * depth profiles * RBS * TEM * AFM
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0191527

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