Výsledky vyhledávání
- 1.0575427 - ÚPT 2024 RIV GB eng A - Abstrakt
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Grant CEP: GA ČR(CZ) GA22-34286S
Grant ostatní: AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
Obor OECD: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Trvalý link: https://hdl.handle.net/11104/0345212 - 2.0567527 - ÚPT 2023 CZ eng A - Abstrakt
Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna Mikmeková, Eliška
Effective IMFP of thin samples via the time-of-flight method.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA ČR(CZ) GA22-34286S
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * SLEEM * inelastic mean free path
Obor OECD: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0338780