Výsledky vyhledávání
- 1.0568817 - ÚPT 2023 RIV CZ eng A - Abstrakt
Mikmeková, Šárka - Čermák, Jan - Ambrož, Ondřej - Jozefovič, Patrik - Zouhar, Martin - Materna-Mikmeková, Eliška
Deep learning powered optical microscopy for steel research.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 347-348. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant ostatní: AV ČR(CZ) LQ100652201
Program: Prémie Lumina quaeruntur
Institucionální podpora: RVO:68081731
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0340087
- 2.0568495 - ÚPT 2023 RIV CZ eng A - Abstrakt
Průcha, Lukáš - Lejeune, M. - Kizovský, Martin - Materna-Mikmeková, Eliška
Combining Low Energy Electron Microscopy and Thermal Raman Spectroscopy for Graphene Analysis.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 166-167. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: graphene * SLEEM * Raman Spectroscopy
Obor OECD: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0339795
- 3.0568482 - ÚPT 2023 RIV CZ eng A - Abstrakt
Paták, Aleš - Zouhar, Martin - Konvalina, Ivo - Materna-Mikmeková, Eliška - Průcha, Lukáš - Müllerová, Ilona - Charvátová Campbell, A.
Ab initio study of angle-resolved electron spectroscopy of graphene.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 156-157. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: density-functional theory * low-energy electron microscopy * many-body perturbation theory
Obor OECD: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0339786
- 4.0568420 - ÚPT 2023 RIV CZ eng A - Abstrakt
Zouhar, Martin - Paták, Aleš - Konvalina, Ivo - Fořt, Tomáš - Materna-Mikmeková, Eliška
Energy-based calibration for quantitative STEM measurements and comparison with 2D-PAD.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 450-451. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
Obor OECD: Optics (including laser optics and quantum optics)
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0339731
- 5.0567527 - ÚPT 2023 RIV CZ eng A - Abstrakt
Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna-Mikmeková, Eliška
Effective IMFP of thin samples via the time-of-flight method.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA ČR(CZ) GA22-34286S
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * SLEEM * inelastic mean free path
Obor OECD: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0338780
- 6.0567516 - ÚPT 2023 RIV CZ eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
Time-of-Flight Spectrometer for Low Landing Energies.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
Obor OECD: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0338771
- 7.0552322 - ÚPT 2022 CZ eng A - Abstrakt
Zouhar, Martin - Paták, Aleš - Materna-Mikmeková, Eliška
Density‑functional theory based study of graphene.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 85.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant ostatní: AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: density‑functional theory * graphene * band structure * density of states * electron energy‑loss spectrum
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Trvalý link: http://hdl.handle.net/11104/0327451
- 8.0552272 - ÚPT 2022 CZ eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant ostatní: AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
Obor OECD: Electrical and electronic engineering
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Trvalý link: http://hdl.handle.net/11104/0327405
- 9.0551134 - ÚPT 2022 RIV US eng A - Abstrakt
Materna-Mikmeková, Eliška - Konvalina, Ivo - Müllerová, Ilona - Lejeune, M. - Asefa, T.
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons.
Microscopy and Microanalysis. Roč. 27, S2 (2020), s. 2682-2684. ISSN 1431-9276. E-ISSN 1435-8115
Institucionální podpora: RVO:68081731
Klíčová slova: carbon based nanomaterials * low energy electron microscopy * contamination * cleaning
Obor OECD: Materials engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D
Trvalý link: http://hdl.handle.net/11104/0326579
- 10.0551132 - ÚPT 2022 RIV US eng A - Abstrakt
Müllerová, Ilona - Konvalina, Ivo - Materna-Mikmeková, Eliška
Methods of the electron induced cleanning in SEM.
Microscopy and Microanalysis. Roč. 27, S1 (2021), s. 2016-2017. ISSN 1431-9276. E-ISSN 1435-8115
Institucionální podpora: RVO:68081731
Klíčová slova: SEM * contamination * electron beam cleaning * graphene
Obor OECD: Electrical and electronic engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/methods-of-the-electron-induced-cleanning-in-sem/54D0340450B8B0BEA7DAD306BCE1C21B
Trvalý link: http://hdl.handle.net/11104/0326577