Výsledky vyhledávání
- 1.0493332 - ÚPT 2019 US eng A - Abstrakt
Müllerová, Ilona - Frank, Luděk - Konvalina, Ivo - Mikmeková, Eliška
Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope.
Microscopy and Microanalysis. Cambridge University Press. Roč. 24, S1 (2018), s. 638-639. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
Grant CEP: GA TA ČR(CZ) TE01020118
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: angular distribution * backscattered electrons * low energy * SEM
Obor OECD: Nano-materials (production and properties)
Trvalý link: http://hdl.handle.net/11104/0286715 - 2.0481331 - ÚPT 2018 CZ eng A - Abstrakt
Frank, Luděk - Mikmeková, Eliška
SEM without black rectangles?
Mikroskopie 2017. Praha: Československá mikroskopická společnost, 2017. s. 20-21.
[Mikroskopie 2017. 09.05.2017-10.05.2017, Bratislava]
Grant CEP: GA TA ČR(CZ) TE01020118
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: SEM * EBID of carbon * graphene
Obor OECD: Coating and films
Trvalý link: http://hdl.handle.net/11104/0276909 - 3.0481149 - ÚPT 2018 AT eng A - Abstrakt
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
Very low energy STEM / TOF system.
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 70.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: STEM/TOF system * ultrathin films * UHV SLEEM
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0276755 - 4.0481148 - ÚPT 2018 AT eng A - Abstrakt
Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Frank, Luděk
What’s next in Scanning Low Energy Electron Microscopy?
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 22.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
Grant CEP: GA TA ČR(CZ) TE01020118
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: SLEEM * primary beam energy * signal electrons
Obor OECD: Nano-materials (production and properties)
Trvalý link: http://hdl.handle.net/11104/0276751 - 5.0480603 - ÚPT 2018 AT eng A - Abstrakt
Řiháček, Tomáš - Müllerová, Ilona
Effect of axial aberrations on the degree of coherence in SEM.
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2017 (SIMDALEE2017). Book of Abstracts.. Wien: Institut für Angewandte Physik, 2017. s. 50.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
Grant CEP: GA TA ČR(CZ) TE01020118
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: axial aberrations * SEM
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0276339