Výsledky vyhledávání
- 1.0467526 - ÚPT 2017 PL eng A - Abstrakt
Řeřucha, Šimon - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej - Yacoot, A.
DBR diode based laser source working at 633 nm for dimensional nanometrology.
NanoScale 2016. 11th Seminar on Quantitative Microscopy (QM) and 7th Seminar on Nanoscale Calibration Standards and Methods. Wroclaw: Wroclaw University of Technology, 2016. s. 109-110.
[NanoScale 2016. Seminar on Quantitative Microscopy (QM) /11./ and Seminar on Nanoscale Calibration Standards and Methods /7./. 09.03.2016-11.03.2016, Wroclaw]
Grant CEP: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
Institucionální podpora: RVO:68081731
Klíčová slova: laser metrology * DBR laser diode * laser interferometry * displacement metrology * laser system
Kód oboru RIV: BH - Optika, masery a lasery
Trvalý link: http://hdl.handle.net/11104/0265622 - 2.0452606 - ÚPT 2016 CZ eng A - Abstrakt
Šiler, Martin - Zemánek, Pavel
Stability and Heating of a Micro-Particle Trapped by Optical Tweezers: FEM Analysis Using Comsol Multiphysics.
Technical Computing Prague 2015. Sborník příspěvků. Praha: Humusoft, 2015.
[Technical Computing Prague 2015. 04.11.2015, Praha]
Grant CEP: GA ČR GB14-36681G
Institucionální podpora: RVO:68081731
Kód oboru RIV: BH - Optika, masery a lasery
Trvalý link: http://hdl.handle.net/11104/0253565