Výsledky vyhledávání
- 1.0575427 - ÚPT 2024 RIV GB eng A - Abstrakt
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Grant CEP: GA ČR(CZ) GA22-34286S
Grant ostatní: AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038DOI: https://doi.org/10.1093/micmic/ozad067.960
Trvalý link: https://hdl.handle.net/11104/0345212 - 2.0571040 - ÚPT 2024 GB eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies.
Microscopy and Microanalysis. Cambridge University Press. Roč. 28, S1 (2022), s. 2432-2434. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA TA ČR(CZ) TN01000008
Grant ostatní: AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institucionální podpora: RVO:68081731
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://academic.oup.com/mam/article/28/S1/2432/6997288DOI: https://doi.org/10.1017/S1431927622009333
Trvalý link: https://hdl.handle.net/11104/0342355 - 3.0568482 - ÚPT 2023 RIV CZ eng A - Abstrakt
Paták, Aleš - Zouhar, Martin - Konvalina, Ivo - Materna Mikmeková, Eliška - Průcha, Lukáš - Müllerová, Ilona - Charvátová Campbell, A.
Ab initio study of angle-resolved electron spectroscopy of graphene.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 156-157. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: density-functional theory * low-energy electron microscopy * many-body perturbation theory
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0339786 - 4.0568420 - ÚPT 2023 RIV CZ eng A - Abstrakt
Zouhar, Martin - Paták, Aleš - Konvalina, Ivo - Fořt, Tomáš - Materna Mikmeková, Eliška
Energy-based calibration for quantitative STEM measurements and comparison with 2D-PAD.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 450-451. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
Obor OECD: Optics (including laser optics and quantum optics)
Web výsledku:
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0339731 - 5.0567527 - ÚPT 2023 CZ eng A - Abstrakt
Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna Mikmeková, Eliška
Effective IMFP of thin samples via the time-of-flight method.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA ČR(CZ) GA22-34286S
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * SLEEM * inelastic mean free path
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0338780 - 6.0567516 - ÚPT 2023 RIV CZ eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna Mikmeková, Eliška
Time-of-Flight Spectrometer for Low Landing Energies.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0338771 - 7.0552322 - ÚPT 2022 CZ eng A - Abstrakt
Zouhar, Martin - Paták, Aleš - Materna Mikmeková, Eliška
Density‑functional theory based study of graphene.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 85.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant ostatní: AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: density‑functional theory * graphene * band structure * density of states * electron energy‑loss spectrum
Web výsledku:
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Trvalý link: http://hdl.handle.net/11104/0327451 - 8.0552272 - ÚPT 2022 CZ eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant ostatní: AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://ava2016-autumn.webnode.cz/
Trvalý link: http://hdl.handle.net/11104/0327405 - 9.0551131 - ÚPT 2022 RIV US eng A - Abstrakt
Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
Institucionální podpora: RVO:68081731
Klíčová slova: time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
Obor OECD: Electrical and electronic engineering
Web výsledku:
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086DOI: https://doi.org/10.1017/S1431927621002609
Trvalý link: http://hdl.handle.net/11104/0326576 - 10.0536979 - ÚPT 2021 CZ eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: electron scattering phenomena
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0314731