Výsledky vyhledávání

  1. 1.
    0517435 - ÚPT 2020 PT eng A - Abstrakt
    Průcha, Lukáš - Piňos, Jakub - Kizovský, Martin - Mikmeková, Eliška
    Graphene surface analysis and layer counting using scanning low energy electron microscopy.
    5th Edition of the European Graphene Forum 2019. Book of Abstracts. Lisbon: SETCOR, 2019.
    [Edition of the European Graphene Forum 2019 /5./. 23.10.2019-25.10.2019, Lisbon]
    Institucionální podpora: RVO:68081731
    Klíčová slova: graphene analysis * low energy electron microscopy * scanning electron microscopy * layer counting
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0302742

               
     
     
  2. 2.
    0501301 - ÚPT 2019 GB eng A - Abstrakt
    Frank, Luděk - Mikmeková, Eliška
    Ultra-low energy SEM/STEM of graphene.
    19th World Congress on Material Science and Engineering. Proceedings. Vol. S7. London: Omics International, 2018. s. 141-142. ISSN 2169-0022.
    [World Congress on Materials Science and Engineering /19./. 11.06.2018-13.06.2018, Barcelona]
    Institucionální podpora: RVO:68081731
    Klíčová slova: ultra-low energy * SEM * STEM * graphene
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0293291

               
     
     
  3. 3.
    0495025 - ÚPT 2019 IN eng A - Abstrakt
    Frank, Luděk - Mikmeková, Eliška
    Microscopy and nanotechnology with extremely slow electrons.
    lnternational Conference on Recent Trends in Materials Science and Technology. ICMST 2018. Proceedings. Thiruvananthapuram: Indian Institute of Space Science and Technology, 2018.
    [lnternational Conference on Recent Trends in Materials Science and Technology. ICMST 2018. 10.10.2018-13.10.2018, Thiruvananthapuram]
    Institucionální podpora: RVO:68081731
    Klíčová slova: extremely slow electrons * microscopy * nanotechnology
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0288059

               
     
     
  4. 4.
    0493332 - ÚPT 2019 US eng A - Abstrakt
    Müllerová, Ilona - Frank, Luděk - Konvalina, Ivo - Mikmeková, Eliška
    Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope.
    Microscopy and Microanalysis. Roč. 24, S1 (2018), s. 638-639. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
    Grant CEP: GA TA ČR(CZ) TE01020118
    GRANT EU: European Commission(XE) 606988 - SIMDALEE2
    Institucionální podpora: RVO:68081731
    Klíčová slova: angular distribution * backscattered electrons * low energy * SEM
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0286715

               
     
     
  5. 5.
    0493331 - ÚPT 2019 US eng A - Abstrakt
    Mikmeková, Eliška - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Daniel, Benjamin - Konvalina, Ivo - Řiháček, Tomáš - Zouhar, Martin - Zaporozchenko, A. - Lejeune, M.
    Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations.
    Microscopy and Microanalysis. Roč. 24, S1 (2018), s. 1564-1565. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
    Grant CEP: GA TA ČR(CZ) TE01020118
    Institucionální podpora: RVO:68081731
    Klíčová slova: low and ultra-low energy * SEM * 2D transition metal dichalcogenides * experiments and simulations
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0286714

               
     
     
  6. 6.
    0481338 - ÚPT 2018 CN eng A - Abstrakt
    Mikmeková, Eliška - Paták, Aleš - Frank, Luděk - Sluyterman, S.
    Scanning Ultra-Low-Energy Electron Microscopy of 2D Crystals.
    BIT's 5th Annual Conference of AnalytiX-2017. Conference Abstract Book. Dalian: BIT Goup Global, 2017. s. 224.
    [BIT's Annual Conference of AnalytiX-2017 /5./. 22.03.2017-24.03.2017, Fukuoka]
    Institucionální podpora: RVO:68081731
    Klíčová slova: ultra-Low-Energy Electron Microscopy * scanning * 2D Crystals
    Obor OECD: Coating and films
    Trvalý link: http://hdl.handle.net/11104/0276916

               
     
     
  7. 7.
    0481337 - ÚPT 2018 CN eng A - Abstrakt
    Frank, Luděk - Mikmeková, Eliška
    Ultralow Energy Scanning Transmission Electron Microscopy and Graphene.
    BIT's 5th Annual Conference of AnalytiX-2017. Conference Abstract Book. Dalian: BIT Goup Global, 2017. s. 223.
    [BIT's Annual Conference of AnalytiX-2017 /5./. 22.03.2017-24.03.2017, Fukuoka]
    Institucionální podpora: RVO:68081731
    Klíčová slova: STEM * graphene * ulatralow energy
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0276914

               
     
     
  8. 8.
    0481331 - ÚPT 2018 CZ eng A - Abstrakt
    Frank, Luděk - Mikmeková, Eliška
    SEM without black rectangles?
    Mikroskopie 2017. Praha: Československá mikroskopická společnost, 2017. s. 20-21.
    [Mikroskopie 2017. 09.05.2017-10.05.2017, Bratislava]
    Grant CEP: GA TA ČR(CZ) TE01020118
    GRANT EU: European Commission(XE) 606988 - SIMDALEE2
    Institucionální podpora: RVO:68081731
    Klíčová slova: SEM * EBID of carbon * graphene
    Obor OECD: Coating and films
    Trvalý link: http://hdl.handle.net/11104/0276909

               
     
     
  9. 9.
    0481148 - ÚPT 2018 AT eng A - Abstrakt
    Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Frank, Luděk
    What’s next in Scanning Low Energy Electron Microscopy?
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 22.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    Grant CEP: GA TA ČR(CZ) TE01020118
    GRANT EU: European Commission(XE) 606988 - SIMDALEE2
    Institucionální podpora: RVO:68081731
    Klíčová slova: SLEEM * primary beam energy * signal electrons
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0276751

               
     
     
  10. 10.
    0481029 - ÚPT 2018 JP eng A - Abstrakt
    Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Konvalina, Ivo - Pokorná, Zuzana - Frank, Luděk
    Characterisation of materials by scanning low energy electron microscope.
    3rd Forum of Center for Advanced Materials Research and International Collaboration (CAMRIC-FORAM3). 13th Light Metals International Workshop By Japan Institute of Light Metals. Toyama: University of Toyama, 2017. s. 14-15.
    [Forum of Center for Advanced Materials Research and International Collaboration (CAMRIC-FORAM3) /3./. Light Metals International Workshop By Japan Institute of Light Metals /13./. 12.10.2017-13.10.2017, Toyama]
    Grant CEP: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212
    Institucionální podpora: RVO:68081731
    Klíčová slova: LEEM * ultra-fine grains * ultrahigh strength * super plasticity
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0276646