Výsledky vyhledávání
- 1.0575442 - ÚPT 2024 GB eng A - Abstrakt
Hotz, M. T. - Martis, J. - Radlička, Tomáš - Bacon, N. J. - Dellby, N. - Lovejoy, T. C. - Quillin, S. C. - Hwang, H. Y. - Singh, P. - Křivánek, O. L.
Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2064-2065. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Institucionální podpora: RVO:68081731
https://academic.oup.com/mam/article/29/Supplement_1/2064/7228064
Trvalý link: https://hdl.handle.net/11104/0345233 - 2.0540306 - ÚPT 2021 CZ eng A - Abstrakt
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
Electron vortex beams in the scanning electron microscope.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: electron vortex beams * SEM
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0317957 - 3.0536979 - ÚPT 2021 CZ eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: electron scattering phenomena
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0314731 - 4.0510317 - ÚPT 2020 DE eng A - Abstrakt
Zouhar, Martin - Daniel, Benjamin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Simulation of optimal measurement setting and calibration of a novel time-offlight spectrometer.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 603-604.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
Grant CEP: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: measurement setting and calibration * novel time-offlight
Obor OECD: Electrical and electronic engineering
https://www.microscopy-conference.de
Trvalý link: http://hdl.handle.net/11104/0300825 - 5.0510315 - ÚPT 2020 DE eng A - Abstrakt
Daniel, Benjamin - Zouhar, Martin - Radlička, Tomáš - Piňos, Jakub - Materna-Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very Low Energy Electron Transmission Spectro-Microscopy.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 609-610.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
Grant CEP: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: very low energy * electron transmission spectro-microscopy
Obor OECD: Electrical and electronic engineering
https://www.microscopy-conference.de
Trvalý link: http://hdl.handle.net/11104/0300821 - 6.0510307 - ÚPT 2020 US eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 482-483. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: two-dimensional (2D) materials * microscopy and spectroscopy * low energy electrons
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0300816 - 7.0481149 - ÚPT 2018 AT eng A - Abstrakt
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
Very low energy STEM / TOF system.
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 70.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: STEM/TOF system * ultrathin films * UHV SLEEM
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0276755 - 8.0431337 - ÚPT 2015 CZ eng A - Abstrakt
Zelinka, Jiří - Oral, Martin - Radlička, Tomáš
Simulation of space charge effects in electron optical systems based on the calculation of current density.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 91. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Institucionální podpora: RVO:68081731
Klíčová slova: space charge * current density evaluation * self-consistent computation * remeshing * FEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236398 - 9.0431333 - ÚPT 2015 CZ eng A - Abstrakt
Knápek, Alexandr - Radlička, Tomáš - Krátký, Stanislav
Design and simulation of a carbon nanotube electron source.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 62. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Institucionální podpora: RVO:68081731
Klíčová slova: field emission * carbon nanotubes * Monte-Carlo simulations * finite element method
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236393 - 10.0431331 - ÚPT 2015 CZ eng A - Abstrakt
Radlička, Tomáš
Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 26. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Institucionální podpora: RVO:68081731
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236391