Košík

  1. 1.
    0519852 - ÚPT 2020 RS eng A - Abstrakt
    Müllerová, Ilona - Daniel, Benjamin - Konvalina, Ivo - Frank, Luděk - Materna-Mikmeková, Eliška
    Advanced techniques for low- and very-low energy SEM using reflected and transmitted signals.
    MCM 2019. 14th Multinational Congress on Microscopy. Proceedings. Belgrade: University of Belgrade, 2019. s. 98-99. ISBN 978-86-80335-11-7.
    [Multinational Congress on Microscopy /14./. 15.09.2019-20.09.2019, Belgrade]
    Grant CEP: GA TA ČR(CZ) TE01020118
    Institucionální podpora: RVO:68081731
    Klíčová slova: very-low energy electron microscopy * very-low energy electron microscopy
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    Obor OECD: Electrical and electronic engineering
    Trvalý link: http://hdl.handle.net/11104/0304834