Košík

0511240 - FZÚ 2020 RIV NL eng M - Část monografie knihy
Fejfar, Antonín - Rezek, Bohuslav - Čermák, Jan
Local current measurements.
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Amsterdam: Elsevier, 2018 - (Klapetek, P.), s. 265-301. Micro and Nano Technologies, 2nd edition. ISBN 978-0-12-813347-7
Institucionální podpora: RVO:68378271
Klíčová slova: atomic force microscopy * local current
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://www.sciencedirect.com/science/article/pii/B9780128133477000108?via%3Dihub
Trvalý link: http://hdl.handle.net/11104/0301569