Košík

0507183 - ÚPT 2020 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Kasl, J. - Mikmeková, Šárka - Jandová, D.
SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing.
EMAS 2013 workshop. 13th Europhean workshop on modern developments and applications in microbeam analysis. Bristol: IOP, 2014, č. článku 012008. IOP Conference Series-Materials Science and Engineering. ISSN 1757-8981.
[European Workshop of the European-Microbeam-Analysis-Society on Modern Developments and Applications in Microbeam Analysis (EMAS) /13./. Porto (PT), 12.05.2013-16.05.2013]
Grant CEP: GA TA ČR(CZ) TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: SEM * SLEEM
Obor OECD: Nano-materials (production and properties)
Trvalý link: http://hdl.handle.net/11104/0298363