Košík

0479964 - FZÚ 2018 eng A - Abstrakt
Ledinský, Martin - Hájková, Zdeňka - Vetushka, Aliaksi - Tomasi, A. - Paviet-Salomon, B. - Despeisse, M. - Řáhová, Jaroslava - Frank, O. - De Wolf, S. - Ballif, C. - Fejfar, Antonín
Profilometry with sub-nanometre precision by Raman spectroscopy.
NANOCON 2016. List of Abstracts. Ostrava: Tanger Ltd., 2016 - (Shrbená, J.). s. 56-56. ISBN 978-80-87294-68-0.
[NANOCON 2016. International Conference /8./. 19.10.2016-21.10.2016, Brno]
Grant CEP: GA ČR GA14-15357S
Institucionální podpora: RVO:68378271 ; RVO:61388955
Klíčová slova: Raman spectroscopy * amorphous silicon thin film * back-contacted heterojunction solar cells * graphene * 2D multilayer materials
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Trvalý link: http://hdl.handle.net/11104/0276010