Košík

0204801 - UPT-D 960040 RIV PL eng C - Konferenční příspěvek (zahraniční konf.)
Frank, Luděk
Width of the SEM and LESEM response function as a tool for the image resolution assessment.
Proceedings of the IX Conference on Electron Microscopy of Solids - EM '96. Kraków: State Committee for Scientific Research, 1996 - (Czyrska-Filemonowicz, A.), s. 109-112. ISBN 83-904805-3-0.
[EM '96 /9./ - Electron Microscopy of Solids. Zakopane (PL), 06.05.1996-09.05.1996]
Grant CEP: GA AV ČR IAA2065502
Trvalý link: http://hdl.handle.net/11104/0100421