Abstract
Time-dependent and constituent-specific spectral changes in soft near-edge x-ray absorption spectroscopy (XAS) of an metal/insulator heterostructure after laser excitation are analyzed at the O K-edge with picosecond time resolution. The oxygen absorption edge of the insulator features a uniform intensity decrease of the fine structure at elevated phononic temperatures, which can be quantified by a simple simulation and fitting procedure presented here. Combining XAS with ultrafast electron diffraction measurements and ab initio calculations demonstrates that the transient intensity changes in XAS can be assigned to a transient lattice temperature. Thus, the sensitivity of transient near-edge XAS to phonons is demonstrated.
- Received 30 April 2021
- Revised 28 July 2021
- Accepted 20 August 2021
DOI:https://doi.org/10.1103/PhysRevB.104.144302
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