Dynamic defectoscopy with flat panel and CdTe Timepix X-ray detectors combined with an optical camera

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Published 30 April 2013 Published under licence by IOP Publishing Ltd
, , Citation D Vavrik et al 2013 JINST 8 C04009 DOI 10.1088/1748-0221/8/04/C04009

1748-0221/8/04/C04009

Abstract

Damage of gradually loaded ductile materials involves a number of physical processes which are highly nonlinear and have different intensity and extent. Dynamic defectoscopy (i.e. defectoscopy of time changing damage processes) combining an X-ray/optical imaging system is proposed for online visualization and analysis of the complex behaviour of such materials. A large area flat panel detector with rather long read out time is used for overall observation of slow damage processes. On the other hand, a semiconductor CdTe Timepix detector with small active area allows following the rapid damage processes occurring in the final phase of specimen failure. Optical imaging of the specimen surface was utilized for analysing the specimen deformations.

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10.1088/1748-0221/8/04/C04009