Počet záznamů: 1  

Effect of medium energy He+, Ne+ and Ar+ ion irradiation on the Hf-In-C thin film composites

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    SYSNO ASEP0557032
    Druh ASEPJ - Článek v odborném periodiku
    Zařazení RIVJ - Článek v odborném periodiku
    Poddruh JČlánek ve WOS
    NázevEffect of medium energy He+, Ne+ and Ar+ ion irradiation on the Hf-In-C thin film composites
    Tvůrce(i) Cannavó, Antonino (UJF-V) ORCID, SAI
    Vacík, Jiří (UJF-V) RID, ORCID, SAI
    Bakardjieva, Snejana (UACH-T) SAI, RID, ORCID
    Kupčík, Jaroslav (UACH-T) SAI, RID, ORCID
    Lavrentiev, Vasyl (UJF-V) RID, ORCID, SAI
    Ceccio, Giovanni (UJF-V) ORCID, RID, SAI
    Horák, Pavel (UJF-V) RID, ORCID
    Němeček, J. (CZ)
    Calcagno, L. (IT)
    Celkový počet autorů9
    Číslo článku139052
    Zdroj.dok.Thin Solid Films. - : Elsevier - ISSN 0040-6090
    Roč. 743, FEB (2022)
    Poč.str.13 s.
    Forma vydáníTištěná - P
    Jazyk dok.eng - angličtina
    Země vyd.CH - Švýcarsko
    Klíč. slovaHafnium ; Indium ; Carbon ; Composite ; Ion radiation ; Ion tolerance ; Hardness
    Obor OECDNuclear related engineering
    CEPEF16_013/0001812 GA MŠk - Ministerstvo školství, mládeže a tělovýchovy
    Výzkumná infrastrukturaCANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i.
    Způsob publikováníOmezený přístup
    Institucionální podporaUJF-V - RVO:61389005 ; UACH-T - RVO:61388980
    UT WOS000784446700001
    EID SCOPUS85122000442
    DOI10.1016/j.tsf.2021.139052
    AnotaceThin films of Hf-In-C ternary compounds were synthesized by a 2-step method consisting of a low-energy ion beam sputtering and thermal annealing. The radiation tolerance of the composites and the effects of irradiation by medium energy light and heavy ions (100 keV He+, 100 keV Ne+, and 200 keV Ar+) with an extreme fluence (10(17) ions/cm(2)) were analyzed by several methods: composition and profiling of elements by Rutherford Backscattering Spectroscopy and Nuclear Resonance Analysis, microstructure and surface morphology by High Resolution Transmission Electron Microscopy and Atomic Force Microscopy, and mechanical properties (elastic modulus and hardness) by nanoindentation.The study showed that the as-prepared Hf-In-C thin films form a mixture of different binary and ternary phases, including nanostructured Hf2InC, and oxides of metallic building elements. The irradiation with light ions (He+) had only a mild effect on the structure, composition, and mechanical properties of the composites. However, irradiation with heavy ions (Ne+, Ar+) led to a significant change in all monitored parameters and an overall collapse of the sample structure (especially for the Ar+ ions). It turned out that although thin Hf-In-C composites show to be highly tolerant to light ions, they have very limited resistivity to medium energy heavy ions.
    PracovištěÚstav jaderné fyziky
    KontaktMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Rok sběru2023
    Elektronická adresahttps://doi.org/10.1016/j.tsf.2021.139052
Počet záznamů: 1