Počet záznamů: 1

Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation

SYSNO ASEP	0539468
Druh ASEP	J - Článek v odborném periodiku
Zařazení RIV	J - Článek v odborném periodiku
Poddruh J	Článek ve WOS
Název	Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
Tvůrce(i)	Mikšová, Romana (UJF-V)_{RID, ORCID, SAI} Jagerová, Adéla (UJF-V)_{ORCID, SAI} Malinský, Petr (UJF-V)_{RID, ORCID, SAI} Harcuba, P. (CZ) Veselý, J. (CZ) Holý, V. (CZ) Kentsch, U. (DE) Macková, Anna (UJF-V)_{RID, ORCID, SAI}
Celkový počet autorů	8
Číslo článku	109773
Zdroj.dok.	Vacuum. - : Elsevier - ISSN 0042-207X Roč. 184, FEB (2021)
Poč.str.	11 s.
Forma vydání	Tištěná - P
Jazyk dok.	eng - angličtina
Země vyd.	GB - Velká Británie
Klíč. slova	Ag-ion implantation ; Yttria-stabilised zirconia ; damage accumulation ; strain relaxation ; nanoparticles
Vědní obor RIV	BG - Jaderná, atomová a mol. fyzika, urychlovače
Obor OECD	Materials engineering
CEP	LM2015056 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
	GA18-03346S GA ČR - Grantová agentura ČR
Způsob publikování	Omezený přístup
Institucionální podpora	UJF-V - RVO:61389005
UT WOS	000604850800002
EID SCOPUS	85091829122
DOI	10.1016/j.vacuum.2020.109773
Anotace	The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
Pracoviště	Ústav jaderné fyziky
Kontakt	Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
Rok sběru	2022
Elektronická adresa	https://doi.org/10.1016/j.vacuum.2020.109773

Počet záznamů: 1