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Laser-wakefield accelerators for high-resolution X-ray imaging of complex microstructures

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    SYSNO ASEP0520770
    Druh ASEPJ - Článek v odborném periodiku
    Zařazení RIVJ - Článek v odborném periodiku
    Poddruh JČlánek ve WOS
    NázevLaser-wakefield accelerators for high-resolution X-ray imaging of complex microstructures
    Tvůrce(i) Hussein, A.E. (US)
    Senabulya, N. (US)
    Ma, Y. (US)
    Streeter, M.J.V. (GB)
    Kettle, B. (GB)
    Dann, S. J. D. (GB)
    Albert, F. (US)
    Bourgeois, N. (GB)
    Cipiccia, S. (GB)
    Cole, J.M. (GB)
    Finlay, O. (GB)
    Gerstmayr, E. (GB)
    Gonzalez, I.G. (SE)
    Higginbotham, A. (GB)
    Jaroszynski, D.A. (GB)
    Falk, Kateřina (FZU-D)
    Krushelnick, K. (US)
    Lemos, N. (US)
    Lopes, N. C. (GB)
    Lumsdon, C. (GB)
    Lundh, O. (SE)
    Mangles, S.P.D. (GB)
    Najmudin, Z. (GB)
    Rajeev, P. P. (GB)
    Schleputz, C.M. (CH)
    Shahzad, M. (CH)
    Šmíd, Michal (FZU-D) RID
    Spesyvtsev, R. (GB)
    Symes, D.R. (GB)
    Vieux, G. (GB)
    Willingale, L. (US)
    Wood, J. C. (GB)
    Shahani, A. J. (US)
    Thomas, A.G.R. (US)
    Celkový počet autorů34
    Číslo článku3249
    Zdroj.dok.Scientific Reports - ISSN 2045-2322
    Roč. 9, č. 1 (2019), s. 1-13
    Poč.str.13 s.
    Jazyk dok.eng - angličtina
    Země vyd.GB - Velká Británie
    Klíč. slovalaser-wakefield accelerators ; particle accelerators ; ultra-relativistic electron beam ; X-ray bright pulse ; imaging applications
    Vědní obor RIVBH - Optika, masery a lasery
    Obor OECDOptics (including laser optics and quantum optics)
    Způsob publikováníOpen access
    Institucionální podporaFZU-D - RVO:68378271
    UT WOS000459983900055
    EID SCOPUS85062258834
    DOI10.1038/s41598-019-39845-4
    AnotaceLaser-wakefield accelerators (LWFAs) are high acceleration-gradient plasma-based particle accelerators capable of producing ultra-relativistic electron beams. Within the strong focusing fields of the wakefield, accelerated electrons undergo betatron oscillations, emitting a bright pulse of X-rays with a micrometer-scale source size that may be used for imaging applications. Non-destructive X-ray phase contrast imaging and tomography of heterogeneous materials can provide insight into their processing, structure, and performance. To demonstrate the imaging capability of X-rays from an LWFA we have examined an irregular eutectic in the aluminum-silicon (Al-Si) system. We present comparisons between the sharpness and spatial resolution in phase contrast images of this eutectic alloy obtained via X-ray phase contrast imaging at the Swiss Light Source (SLS) synchrotron and X-ray projection microscopy via an LWFA source.
    PracovištěFyzikální ústav
    KontaktKristina Potocká, potocka@fzu.cz ; Eva Popovová, popovova@fzu.cz Tel.: 220 318 579
    Rok sběru2020
    Elektronická adresahttp://hdl.handle.net/11104/0305439
Počet záznamů: 1