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Synthesis, structural and electrical characterizations of DySr.sub.5./sub.Ni.sub.2.4./sub.Cu.sub.0.6./sub.O.sub.12-δ./sub..
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SYSNO ASEP 0369776 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Synthesis, structural and electrical characterizations of DySr5Ni2.4Cu0.6O12-δ. Tvůrce(i) Hamdi, S. (TN)
Ouni, S. (TN)
Chaker, H. (TN)
Rohlíček, Jan (FZU-D) RID, ORCID
Ben Hassen, R. (TN)Zdroj.dok. Journal of Solid State Chemistry. - : Elsevier - ISSN 0022-4596
Roč. 184, č. 11 (2011), s. 2897-2901Poč.str. 5 s. Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova Rietveld refinement ; K2NiF4-type structure ; electrical resistivity ; oxygen vacancies ; iodometric titration Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000296404200010 DOI 10.1016/j.jssc.2011.08.033 Anotace A new compound DySr5Ni2.4Cu0.6O12-δ has been prepared by sol gel method and annealed at 1473 K in 1 atm of Ar gas flow. The X-ray diffraction (XRD) is used for phase identification. The sample shows to adopt the K2NiF4-type structure based on tolerance factor calculation. XRD analysis using the Rietveld method was carried out and it was found that DySr5Ni2.4Cu0.6O12-δ (Dy0.33Sr1.67Ni0.8Cu0.2O4-δ) compound crystallizes in tetragonal symmetry with space group I4/mmm (Z = 2). The lattice parameters are found to be at room temperature a = 3.7696(5) ˚A and c = 12.3747(2) A . The final relia! bility indices were: RB = 5.219% and χ2 = 3.47. Four probe electrical resistivity measurements were performed versus temperature in the range 294-579 K. A semiconducting behaviour over the whole range of temperature, with a conductivity maximum of 0.4 S cm-1 is observed at 510 K. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2012
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