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Imprint behavior of piezoelectric PZT thin films deposited onto Cu-coated polymer substrates
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SYSNO ASEP 0367916 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Imprint behavior of piezoelectric PZT thin films deposited onto Cu-coated polymer substrates Tvůrce(i) Suchaneck, G. (DE)
Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
Čada, Martin (FZU-D) RID, ORCID, SAI
Kiselev, D.A. (PT)
Bdikin, I. (PT)
Levin, A.A. (DE)
Jastrabík, Lubomír (FZU-D) RID, ORCID
Kholkin, A. L. (PT)
Gerlach, G. (DE)
Dejneka, Alexandr (FZU-D) RID, ORCIDZdroj.dok. Ferroelectrics. - : Taylor & Francis - ISSN 0015-0193
Roč. 419, č. 1 (2011), s. 103-108Poč.str. 6 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova plasma deposition ; PZT ; imprint ; piezoresponse force microscopy Vědní obor RIV BH - Optika, masery a lasery CEP GC202/09/J017 GA ČR - Grantová agentura ČR KAN301370701 GA AV ČR - Akademie věd CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000298541800019 DOI 10.1080/00150193.2011.594754 Anotace In this work, we investigate the imprint behavior of lead-rich Pb(Zr, Ti)O3 (PZT) thin films deposited onto copper-coated Kapton® substrates by piezoresponse force microscopy. As-deposited films, consisting of a mixture of PZT and lead and zirconium oxides, had a strongly imprinted polarization state with a polarization vector pointing toward the film surface. Above a threshold field of about 10 V/μm, a steeply increasing piezoelectric response without hysteresis was obtained. With increasing voltage cycling, the threshold field increases and a one-sided piezoresponse hysteresis is obtained. The described imprint behavior is related to initially trapped charge carriers and their detrapping under voltage cycling. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2012
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