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In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires
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SYSNO ASEP 0365167 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires Tvůrce(i) Malard, B. (FR)
Pilch, Jan (FZU-D) RID
Šittner, Petr (FZU-D) RID, ORCID
Delville, R. (BE)
Curfs, C. (FR)Zdroj.dok. Solid State Phenomena - ISSN 1012-0394
172-174, č. 6 (2011), s. 1243-1248Poč.str. 6 s. Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova recovery process ; electropulse treatment ; in-situ analysis ; superelasticity Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEP IAA200100627 GA AV ČR - Akademie věd LA10010 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy CEZ AV0Z10100520 - FZU-D (2005-2011) UT WOS 000303359700192 DOI 10.4028/www.scientific.net/SSP.172-174.1243 Anotace Recovery processes responsible for evolution of microstructures in 0.1mm thin cold-drawn Ni-Ti shape memory alloy wire heat treated by DC electric pulse were investigated by combination of in-situ tensile stress - strain, electrical resistance and X-ray diffraction measurements. The X-ray data were used to obtain direct experimental information on the evolution of the phase fractions, internal strain and defects in the microstructure evolving through activation of a sequence of recovery processes during the short time electropulse treatment. It is shown that superelastic functional properties of the treated Ni-Ti wire can be precisely set by controlling the progress of the recovery processes by prescribing the time evolution of temperature T(t) and tensile stress s(t) (displacement control) in the treated wire. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2012
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