Počet záznamů: 1

Prospects of the scanning low energy electron microscopy in materials science

SYSNO ASEP	0350665
Druh ASEP	C - Konferenční příspěvek (mezinárodní konf.)
Zařazení RIV	D - Článek ve sborníku
Název	Prospects of the scanning low energy electron microscopy in materials science
Tvůrce(i)	Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Hovorka, Miloš (UPT-D) Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Celkový počet autorů	5
Zdroj.dok.	Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. - Brno : Institute of Scientific Instruments AS CR, v.v.i, 2010 / Mika F. - ISBN 978-80-254-6842-5
Rozsah stran	s. 37-38
Poč.str.	2 s.
Akce	International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./
Datum konání	31.05.2010-04.06.2010
Místo konání	Skalský dvůr
Země	CZ - Česká republika
Typ akce	WRD
Jazyk dok.	eng - angličtina
Země vyd.	CZ - Česká republika
Klíč. slova	scanning low energy electron microscopy ; scanning electron microscopy ; transmission electron microscopy ; focused ion beam microscopy ; cathode lens mode
Vědní obor RIV	JA - Elektronika a optoelektronika, elektrotechnika
CEP	OE08012 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
CEZ	AV0Z20650511 - UPT-D (2005-2011)
UT WOS	000290773700013
Anotace	The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Various techniques exist which are capable of studying the material microstructure, with the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channeling, mostly in the Mott scattering angular range.
Pracoviště	Ústav přístrojové techniky
Kontakt	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Rok sběru	2011

Počet záznamů: 1