Počet záznamů: 1
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO.sub.2./sub. nanoparticles
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SYSNO ASEP 0349618 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles Tvůrce(i) Suzuki-Muresan, T. (FR)
Deniard, P. (FR)
Gautron, E. (FR)
Petříček, Václav (FZU-D) RID, ORCID, SAI
Jobic, S. (FR)
Grambow, B. (FR)Zdroj.dok. Journal of Applied Crystallography. - : Wiley - ISSN 0021-8898
Roč. 43, Part 5 (2010), 1092-1099Poč.str. 8 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova x-ray diffraction ; Rietveld refinement ; nanoparticles Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000281996600021 DOI 10.1107/S0021889810032358 Anotace Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2011
Počet záznamů: 1