Počet záznamů: 1  

Interpretation of Profile and Intercept Counts in Microstructure Characterization

  1. 1.
    SYSNO ASEP0343472
    Druh ASEPC - Konferenční příspěvek (mezinárodní konf.)
    Zařazení RIVD - Článek ve sborníku
    NázevInterpretation of Profile and Intercept Counts in Microstructure Characterization
    Tvůrce(i) Saxl, Ivan (MU-W) RID, SAI
    Sklenička, Václav (UFM-A) RID, ORCID
    Zdroj.dok.Recent Developments in the Processing and applications of Structural Metals and Alloys. - Zurich : Trans Tech Publications LTD, 2009 / Cabibbo M. ; Spigarelli S. - ISSN 0255-5476
    Rozsah strans. 403-410
    Poč.str.8 s.
    AkceRecent Developments in the Processing and Applications of Structural Metals and Alloys
    Datum konání22.06.2008-25.06.2008
    Místo konáníComo
    ZeměIT - Itálie
    Typ akceWRD
    Jazyk dok.eng - angličtina
    Země vyd.CH - Švýcarsko
    Klíč. slovamicrostructure characterization ; intercept count ; grain density ; metallography
    Vědní obor RIVBA - Obecná matematika
    CEPIAA2041301 GA AV ČR - Akademie věd
    GA201/06/0302 GA ČR - Grantová agentura ČR
    CEZAV0Z10190503 - MU-W (2005-2011)
    AV0Z20410507 - UFM-A (2005-2011)
    UT WOS000263555900038
    AnotaceThe results of intercept and profile counts are commonly interpreted as a suitable estimates of the mean grain size as represented e.g. by the grain density N-V, The term grain size is not explicitly defined even when some relation to grain volume and/or mean grain breadth (the mean Ferret diameter) is tacitly assumed. However, the intercept count N-L is directly related to the mean value of grain boundary area per unit volume S-V and the profile count N-A is, under relatively general assumptions, directly related to the mean value of grain junctions per unit volume L-V. Their relation to N-V can be generally written as N-V = c'(N-A)(3/2) = c ''(N-L)(3), but the coefficients c' and c '' strongly depend on the structural characteristics like grain size dispersion, anisotropy etc. and their evaluation is far from being simple. Consequently, whereas the reliable estimates of S-V and L-V result from intercept and profile counts, the estimate of grain density based on them requires a careful consideration.
    PracovištěMatematický ústav
    KontaktJarmila Štruncová, struncova@math.cas.cz, library@math.cas.cz, Tel.: 222 090 757
    Rok sběru2011
Počet záznamů: 1  

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