Počet záznamů: 1
Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
- 1.
SYSNO ASEP 0343393 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy Tvůrce(i) Pavluch, J. (CZ)
Zommer, L. (PL)
Mašek, K. (CZ)
Skála, T. (IT)
Šutara, F. (CZ)
Nehasil, V. (CZ)
Píš, I. (CZ)
Polyak, Yaroslav (UFCH-W)Zdroj.dok. Analytical Sciences - ISSN 0910-6340
Roč. 26, č. 2 (2010), s. 209-215Poč.str. 7 s. Jazyk dok. eng - angličtina Země vyd. JP - Japonsko Klíč. slova non-evaporable getter materials ; XPS methods Vědní obor RIV CF - Fyzikální chemie a teoretická chemie CEZ AV0Z40400503 - UFCH-W (2005-2011) UT WOS 000274977700012 EID SCOPUS 77949895185 DOI 10.2116/analsci.26.209 Anotace Non-evaporable Ti-Zr-V ternary getters (NEGs) were studied by means of excitation energy resolved photoelectron spectroscopy (ERXPS). We attempted a quantitative study of the in-depth redistribution of the NEG components during activation. The samples were prepared ex-situ by DC magnetron sputtering on a stainless-steel substrate. The ERXPS measurements were carried out at two incident photoelectron beam angles at energies of 110, 195, 251, 312, 397 and 641 eV. Besides these photon energies, also standard X-ray photoelectron spectroscopy (XPS) was used at a photon energy of 1254 eV. We accumulated Ti 3s, Ti 3p, Ti 3d, V 3s, V 3p, V 3d, Zr 3p, Zr 3d, Zr 4s, Zr 4p, Zr 4d, C 1s, O 1s and O 2s photoelectron peak intensities as functions of the kinetic energies given to them. Under simplifying assumptions, Monte-Carlo calculations of the activated sample concentration profiles were performed to fit the measured spectra intensities. Pracoviště Ústav fyzikální chemie J.Heyrovského Kontakt Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196 Rok sběru 2011
Počet záznamů: 1