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Calculation of aberration coefficients by ray tracing
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SYSNO ASEP 0333615 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Calculation of aberration coefficients by ray tracing Tvůrce(i) Oral, Martin (UPT-D) RID, ORCID, SAI
Lencová, Bohumila (UPT-D) RID, SAICelkový počet autorů 2 Zdroj.dok. Ultramicroscopy. - : Elsevier - ISSN 0304-3991
Roč. 109, č. 11 (2009), s. 1365-1373Poč.str. 9 s. Jazyk dok. eng - angličtina Země vyd. NL - Nizozemsko Klíč. slova Aberrations ; Aberration coefficients ; Ray tracing ; Regression ; Fitting Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika CEP IAA100650805 GA AV ČR - Akademie věd CEZ AV0Z20650511 - UPT-D (2005-2011) UT WOS 000270765800008 DOI 10.1016/j.ultramic.2009.07.001 Anotace We present an approach for the calculation of aberration coefficients using accurate ray tracing. For a given optical system, intersections of a large number of trajectories with a given plane are computed. In the Gaussian image plane the imaging with the selected optical system can be described by paraxial and aberration coefficients (geometric and chromatic) that can be calculated by least-squares fitting of the analytical model on the computed trajectory positions. An advantage of such a way of computing the aberration coefficients is that, in comparison with the aberration integrals and the differential algebra method, it is relatively easy to use and its complexity stays almost constant with the growing complexity of the optical system. This paper shows a tested procedure for choosing proper initial conditions and computing the coefficients of the fifth-order geometrical and third-order, first-degree chromatic aberrations by ray tracing on an example of a weak electrostatic lens. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2010
Počet záznamů: 1