Počet záznamů: 1
Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
- 1.Germer, S. - Pietag, F. - Polák, Jaroslav - Arnold, T.
Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
Review of Scientific Instruments. Roč. 87, č. 11 (2016), č. článku 113301. ISSN 0034-6748. E-ISSN 1089-7623.
[Topical Conference on High-Temperature Plasma Diagnostics/21./. Madison, 05.06.2016-09.06.2016]
Obor OECD: 2.11 Other engineering and technologies
Impakt faktor: 1.515, rok: 2016
http://aip.scitation.org/doi/full/10.1063/1.4964701
http://hdl.handle.net/11104/0267029
Počet záznamů: 1