Počet záznamů: 1
Mapping of Dopants in Silicon by Injection of Electrons
- 1.Hovorka, Miloš - Frank, Luděk
Mapping of Dopants in Silicon by Injection of Electrons.
Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 15-18. ISBN 978-4-9903248-2-7.
[JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
http://hdl.handle.net/11104/0192000
Počet záznamů: 1