Počet záznamů: 1
Laser Source for Interferometry in Nanometrology
- 1.Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Čížek, Martin
Laser Source for Interferometry in Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 541: 1-6. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
http://hdl.handle.net/11104/0191764
Počet záznamů: 1