Core level photoemission and STM characterization of Ta/Si(111)-7x7 interfaces

Shukrynau, Pavel - Dudr, Viktor - Švec, Martin - Vondráček, Martin - Mutombo, Pingo - Skála, T. - Šutara, F. - Matolín, V. - Prince, K. C. - Cháb, Vladimír
Core level photoemission and STM characterization of Ta/Si(111)-7x7 interfaces.
Surface Science. Roč. 603, č. 3 (2009), s. 469-476. ISSN 0039-6028. E-ISSN 1879-2758
Impakt faktor: 1.798, rok: 2009
http://hdl.handle.net/11104/0180865