Počet záznamů: 1
Profiling of N-type dopants in silicon structures
- 1.Hovorka, Miloš - Mika, Filip - Frank, Luděk
Profiling of N-type dopants in silicon structures.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 181-182. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
http://www.univie.ac.at/asem/Graz_MC_09/papers/19923.pdf
http://hdl.handle.net/11104/0179772
Počet záznamů: 1