Počet záznamů: 1
SHIM and TPEM: Getting More Information from Non Linear Excitation
- 1.Bianchini, P. - Vicidomini, G. - Mondal, P. P. - Ramoino, P. - Usai, C. - Janáček, Jiří - Kubínová, Lucie - Diaspro, A.
SHIM and TPEM: Getting More Information from Non Linear Excitation.
Focus on Microscopy. Valencia: University of Valencia, 2007. s. 136-136.
[Focus on Microscopy FOM 2007. 10.04.2007-13.04.2007, Valencia]
http://hdl.handle.net/11104/0164229
Počet záznamů: 1