Počet záznamů: 1  

Quantitative depth profiling of K-doped fullerene films using XPS and SIMS

  1. 1.
    Oswald, S. - Janda, Pavel - Dunsch, L.
    Quantitative depth profiling of K-doped fullerene films using XPS and SIMS.
    Microchimica Acta. Roč. 141, 1-2 (2003), s. 79-85. E-ISSN 1436-5073
    Impakt faktor: 0.784, rok: 2003
    http://hdl.handle.net/11104/0132039