Počet záznamů: 1  

About the information depth of backscattered electron imaging

  1. 1.
    Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
    About the information depth of backscattered electron imaging.
    Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720
    Obor OECD: Materials engineering
    Impakt faktor: 1.693, rok: 2017
    http://hdl.handle.net/11104/0273494