Počet záznamů: 1
In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires
- 1.Malard, B. - Pilch, Jan - Šittner, Petr - Delville, R. - Curfs, C.
In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires.
Solid State Phenomena. 172-174, č. 6 (2011), s. 1243-1248. ISSN 1012-0394
http://hdl.handle.net/11104/0200473
Počet záznamů: 1