Počet záznamů: 1
Characterization and Properties of Titanium-Vanadium Oxide Thin Films Prepared by ArF Laser Ablation
- 1.Fajgar, Radek - Kupčík, Jaroslav - Šubrt, Jan - Novotný, F.
Characterization and Properties of Titanium-Vanadium Oxide Thin Films Prepared by ArF Laser Ablation.
Conference Proceedings. Ostrava: TANGER, 2010, s. 398-402. ISBN 978-80-87294-19-2.
[NANOCON 2010. International Conference /2./. Olomouc (CZ), 12.10.2010-14.10.2010]
http://hdl.handle.net/11104/0195545
Počet záznamů: 1