Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction

Holý, V. - Martí, X. - Horák, L. - Caha, O. - Novák, Vít - Cukr, Miroslav - Schülli, T. U.
Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction.
Applied Physics Letters. Roč. 97, č. 18 (2010), 181913/1-181913/3. ISSN 0003-6951. E-ISSN 1077-3118
Impakt faktor: 3.820, rok: 2010
http://hdl.handle.net/11104/0193270