Počet záznamů: 1
Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements
- 1.Ge, Y. - Heczko, Oleg - Hannula, S.-P. - Fähler, S.
Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements.
Acta Materialia. Roč. 58, č. 20 (2010), 6665-6671. ISSN 1359-6454. E-ISSN 1873-2453
Impakt faktor: 3.781, rok: 2010
http://hdl.handle.net/11104/0192458
Počet záznamů: 1