Počet záznamů: 1
Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy
- 1.Landa, Michal - Růžek, Michal - Sedlák, Petr - Seiner, Hanuš - Bodnárová, Lucie - Zídek, Jan
Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy.
Journal of Physics: Conference Series. Roč. 214, č. 1 (2010), s. 1-5. ISSN 1742-6588. E-ISSN 1742-6596.
[International Conference on Photoacoustic and Photothermal Phenomena /15./. Leuven, 19.07.2009-23.07.2009]
http://iopscience.iop.org/1742-6596/214/1/012045/
http://hdl.handle.net/11104/0185069
Počet záznamů: 1