Počet záznamů: 1
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
- 1.Sadewasser, S. - Jelínek, Pavel - Fang, Ch.-K. - Custance, Ó. - Yamada, Y. - Sugimoto, Y. - Abe, M. - Morita, S.
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
Physical Review Letters. Roč. 103, č. 26 (2009), 266103/1-266103/4. ISSN 0031-9007. E-ISSN 1079-7114
Impakt faktor: 7.328, rok: 2009
http://hdl.handle.net/11104/0183034
Počet záznamů: 1