Počet záznamů: 1
Advanced x-ray optics with Si wafers and slumped glass
- 1.Hudec, René - Maršíková, V. - Míka, M. - Sik, J. - Lorenz, M. - Pína, L. - Inneman, A. - Skulinová, Michaela
Advanced x-ray optics with Si wafers and slumped glass.
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Bellingham: SPIE, 2009 - (O'Dell, S.), 74370S-1-74370S-12. Proceedings of the SPIE, 7437. ISBN 9780819477279. ISSN 0277-786X.
[Optics for EUV, X-Ray, and Gamma-Ray Astronomy /4./. San Diego (US), 31.08.2009-31.08.2009]
http://dx.doi.org/10.1117/12.827978
http://hdl.handle.net/11104/0181714
Počet záznamů: 1