Počet záznamů: 1
Scintillation secondary electron detector for variable pressure scanning electron microscope
- 1.Čudek, P. - Jirák, Josef - Neděla, Vilém
Scintillation secondary electron detector for variable pressure scanning electron microscope.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 221-222. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
http://www.univie.ac.at/asem/Graz_MC_09/papers/95710.pdf
http://hdl.handle.net/11104/0179776
Počet záznamů: 1