Počet záznamů: 1
Secondary electron contrast in doped semiconductor with presence of a surface ad-layer
- 1.Mika, Filip - Hovorka, Miloš - Frank, Luděk
Secondary electron contrast in doped semiconductor with presence of a surface ad-layer.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 199-200. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
http://www.univie.ac.at/asem/Graz_MC_09/papers/51426.pdf
http://hdl.handle.net/11104/0179773
Počet záznamů: 1